High-Temperature X-Ray Diffraction Study on Stability of the Infinite-Layer SrCuO2

✍ Scribed by Xingjiang Zhou; Cheng Dong; Fei Wu; Hong Chen; Guangcan Che; Yushu Yao; Zhongxian Zhao

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 142 KB
• Volume: 112
• Category: Article
• ISSN: 0022-4596
• DOI: 10.1006/jssc.1994.1291

✦ Synopsis

The stability of the infinite-layer (\mathrm{SrCuO}{2}) upon heating in air has been investigated by high-temperature (\mathrm{X})-ray diffraction. Above (300^{\circ} \mathrm{C}) the infinite-layer (\mathrm{SrCuO}{2}) reacted gradually with (\mathrm{CO}{2}) in air to form (\mathrm{SrCO}{3}); at a temperature over (400^{\circ} \mathrm{C}), the infinite-layer (\mathrm{SrCuO}{2}) transformed into orthorhombic (\mathrm{SrCuO}{2}), with an abrupt decrease of the amount of the infinite-layer phase in the sample. The lattice parameters (a) and (c) of the infinite-layer (\mathrm{SrCuO}_{2}) showed different thermal expansion coefficients, i.e., (d a / d T=3.329 \times) (10^{-5}) and (d c / d T=5.801 \times 10^{-5} \AA /{ }^{\circ} \mathrm{C}). (\odot 1994) Academic Press, Inc.