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X-Ray Diffraction Study of the Ultrathin Al2O3 Layer on NiAl(110).

✍ Scribed by A. Stierle; F. Renner; R. Streitel; H. Dosch; W. Drube; Cowie. B. C. Cowie. B. C.

Publisher: John Wiley and Sons
Year: 2004
Weight: 56 KB
Volume: 35
Category: Article
ISSN: 0931-7597
DOI: 10.1002/chin.200422019

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