N-atom concentration profiles were measured in highly diluted C 2 N 2 /NO/Ar reaction systems behind reflected shock waves at temperatures between 3050 K and 4430 K by applying atomic resonance absorption spectroscopy (ARAS). C 2 N 2 served as a thermal source for CN radical which react with both, N
High-temperature reaction of C2 with NO including product channel measurements
โ Scribed by T. Kruse; P. Roth
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 251 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0538-8066
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โฆ Synopsis
The reaction of C 2 radicals with NO was studied behind reflected shock waves in the temperature range
The shock-induced pyrolysis of acetylene, highly 3150 K ี T ี 3950 K. diluted in argon, was used as a well defined source for C 2 radicals, which were detected by ring-dye-laser absorption spectroscopy (RDLAS) at
The perturbation of the C 2 by 516.646 nm. the addition of NO to the initial mixtures results in a fast removal of the C 2 radicals, which is mainly caused by the reaction: k 5 C ฯฉ NO 9 9 : products (R5) 2 for which the overall rate coefficient 13 3 ฯช1 ฯช1
k ฯญ 7.5 ฯซ 10 ฯซ exp(ฯช4350/T)cm mol s 5 was obtained. The product channels of this reaction were studied by additional measurements of O-atoms, N-atoms, and CN radicals. O and N were detected using atomic resonance absorption spectroscopy (ARAS) and the CN radicals were followed by their emission using a spectrograph and an intensified CCD-camera. The reactions leading to the product channels and to were identified as the main channels with a branching
ratio of and while the channel leading to was found k /k ฯญ 70% k /k ฯญ 30%, CN ฯฉ CO (R5c) 5a 5 5 b 5 to be neglectable.
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