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High temperature property studies of the 6H-SiC MOS capacitor

✍ Scribed by WeiBing Mu; Min Gong; Qun Cao

Book ID: 107363864
Publisher: Science in China Press (SCP)
Year: 2010
Tongue: English
Weight: 448 KB
Volume: 54
Category: Article
ISSN: 1672-1799
DOI: 10.1007/s11433-010-4187-7

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