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High Temperature Electrical Characterization of 4H-SiC MESFET Basic Logic Gates

✍ Scribed by Alexandru, Mihaela; Banu, Viorel; Florentin, Matthieu; Jordá, Xavier; Vellvehi, Miguel; Tournier, Dominique

Book ID: 125834395
Publisher: Trans Tech Publications, Ltd.
Year: 2014
Tongue: English
Weight: 478 KB
Volume: 778-780
Category: Article
ISSN: 1662-9752
DOI: 10.4028/www.scientific.net/MSF.778-780.1130

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