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High-resolution X-ray diffraction studies of molecular beam epitaxy-grown HgCdTe heterostructures and CdZnTe substrates

✍ Scribed by R. H. Sewell; C. A. Musca; J. M. Dell; L. Faraone; B. F. Usher; T. Dieing

Book ID
107453329
Publisher
Springer US
Year
2005
Tongue
English
Weight
247 KB
Volume
34
Category
Article
ISSN
0361-5235

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We have investigated the effect of substrate temperature (Ts varied from 410 to 560Β°C) on the crystalline and optical properties of In l\_x\_rGaxAlyAs layers grown on InP substrates by molecular beam epitaxy (MBE). The quaternary samples were analysed using double axis X-ray diffraction (XRD), low t