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High-resolution x-ray analysis of InGaN/GaN superlattices grown on sapphire substrates with GaN layers

✍ Scribed by Li, Wei; Bergman, Peder; Ivanov, Ivan; Ni, Wei-Xin; Amano, H.; Akasa, I.

Book ID: 120262382
Publisher: American Institute of Physics
Year: 1996
Tongue: English
Weight: 338 KB
Volume: 69
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.117269

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