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High-resolution transmission electron microscopy of planar defects in YBa2Cu4Oy doped with Ca

✍ Scribed by Yoshio Matsui; Fujio Izumi; Kasumi Yanagisawa; Yuh Yamada; Takehiko Matsumoto; Yasuharu Kodama

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 143 KB
Volume: 185-189
Category: Article
ISSN: 0921-4534
DOI: 10.1016/0921-4534(91)92069-n

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