✦ LIBER ✦

High resolution sputter depth profiling of implantation structures in Si by low energy SNMS

✍ Scribed by Oechsner, H.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Auger electron spectroscopy investigatio

✍ R. Kosiba; G. Ecke; J. Liday; J. Breza; O. Ambacher 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 175 KB

Depth profiling of dopants implanted in

✍ Y. Kayser; D. Banaś; W. Cao; J.-Cl. Dousse; J. Hoszowska; P. Jagodziński; M. Kav 📂 Article 📅 2012 🏛 John Wiley and Sons 🌐 English ⚖ 789 KB

High resolution low energy resonance dep

✍ G. Battistig; G. Amsel; I. Trimaille; J.-J. Ganem; S. Rigo; F.C. Stedile; I.J.R. 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 489 KB

Composition and structure of the native

✍ Amir H. Al-Bayati; Kevin G. Orrman-Rossiter; J.A. van den Berg; D.G. Armour 📂 Article 📅 1991 🏛 Elsevier Science ⚖ 63 KB

In-depth profiling of the SiO2/Si-interf

✍ Aoto Nahomi; Ikawa Eiji; Endo Nobuhiro; Kurogi Yukinori 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 559 KB

Determination by Raman scattering of the

✍ R. Arès; Y.B. Trudeau; J.L. Brebner; G.E. Kajrys; M. Jouanne 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 478 KB