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High-resolution optical methods for characterization of polycrystalline GaAs thin films

✍ Scribed by Wagner, D.K.; Fletcher, R.M.; Ballantyne, J.M.

Book ID: 114593651
Publisher: IEEE
Year: 1980
Tongue: English
Weight: 496 KB
Volume: 27
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1980.20254

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## Abstract We present the first detailed report that directly correlates the reduced contact resistance in organic thin‐film transistors (TFTs) with fundamental structural and morphological characterization at the organic semiconductor/conducting polymer interface. Specifically, the pentacene grai