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Characterization of the “native” surface thin film on pure polycrystalline iron: A high resolution XPS and TEM study

✍ Scribed by G. Bhargava; I. Gouzman; C.M. Chun; T.A. Ramanarayanan; S.L. Bernasek


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
891 KB
Volume
253
Category
Article
ISSN
0169-4332

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