✦ LIBER ✦
Characterization of the “native” surface thin film on pure polycrystalline iron: A high resolution XPS and TEM study
✍ Scribed by G. Bhargava; I. Gouzman; C.M. Chun; T.A. Ramanarayanan; S.L. Bernasek
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 891 KB
- Volume
- 253
- Category
- Article
- ISSN
- 0169-4332
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