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High-resolution medium-energy backscattering spectrometry

โœ Scribed by Marcus H. Mendenhall; Robert A. Weller


Book ID
113281512
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
386 KB
Volume
59-60
Category
Article
ISSN
0168-583X

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The potential of high resolution Rutherford Backscattering (RBS) for identification and quantification of trace elements in thin films was investigated. A beam of 250 keV d + ions from the AN700 van de Graaff accelerator in Linz was used to characterize the composition of an organic multi-element co