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High-resolution measurements of thermal expansion along the uniqueb-axis of squaric acid

✍ Scribed by T. H. Johansen; J. Feder; T. Jøssang

Book ID
112543193
Publisher
Springer
Year
1984
Tongue
English
Weight
680 KB
Volume
56
Category
Article
ISSN
1434-6036

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High resolution measurement of the therm
High resolution measurement of the thermal expansion coefficient of semiconductor multilayer lateral nanostructures
✍ Brüser, B. ;Panzner, T. ;Grigorian, S. ;Grenzer, J. ;Zorn, M. ;Zeimer, U. ;Piets 📂 Article 📅 2008 🏛 John Wiley and Sons 🌐 English ⚖ 381 KB

## Abstract We measured the thermal expansion coefficient (TEC) of a vertically stacked multi‐quantum‐well (MQW) structure buried under a thick GaAs top layer before and after lateral patterning of the GaAs top layer. After patterning the TEC of the whole MQW structure differs from that of the plan