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High-resolution images of ordered alloys by high-voltage electron microscopy

✍ Scribed by Shindo, D.


Book ID
114523108
Publisher
International Union of Crystallography
Year
1982
Weight
700 KB
Volume
38
Category
Article
ISSN
0567-7394

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Dislocations in silicon observed by high
✍ K. Hiraga; M. Hirabayashi; M. Sato; K. Sumino πŸ“‚ Article πŸ“… 1982 πŸ› John Wiley and Sons 🌐 English βš– 600 KB

## Abstract Dislocations in deformed silicon crystals have been studied by high‐resolution electron microscopy with the axial illumination along the [110] direction using a 1 MV electron microscope. Extended 60 dislocations, Z‐shape faulted dipoles and stacking fault tetrahedra were observed in ato