✦ LIBER ✦

Imaging of the SOI interface by high resolution electron microscopy

✍ Scribed by Yan, Yong ;Ji, Fuquan ;Chen, Jun ;Feng, Duan

Publisher: John Wiley and Sons
Year: 1988
Tongue: English
Weight: 459 KB
Volume: 110
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211100138

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of interfaces by high r

Characterization of interfaces by high resolution electron microscopy

✍ D.R. Clarke 📂 Article 📅 1981 🏛 Elsevier Science 🌐 English ⚖ 79 KB

High-resolution electron microscopy of c

High-resolution electron microscopy of ceramic interfaces

✍ Ishida, Yoichi ;Hagege, Serge ;Ichinose, Hideki ;Takahashi, Yutaka 📂 Article 📅 1989 🏛 Wiley (John Wiley & Sons) 🌐 English ⚖ 968 KB

Imaging of interfaces in semiconductor m

Imaging of interfaces in semiconductor materials using high resolution transmission electron microscopy

✍ Fernando A. Ponce 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 786 KB

Imaging of carbon nanoclusters by high-r

Imaging of carbon nanoclusters by high-resolution scanning electron microscopy

✍ Dan Zhou; Supapan Seraphin 📂 Article 📅 1994 🏛 John Wiley and Sons 🌐 English ⚖ 267 KB

Carbon nanoclusters, produced from an arc-discharge between graphite electrodes under helium atmosphere , show a rich variety of shapes that reflect a strict discipline of the growth and may ultimately delineate the growth mechanism (Seraphin et al., 1994a). High-Resolution Transmission Electron Mic

InP-insulator interface structure studie

InP-insulator interface structure studied by high resolution transmission electron microscopy

✍ Nozaki, C.; Yasuami, S.; Ishimura, H.; Tokuda, H. 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 424 KB

Quantification in high-resolution electr

Quantification in high-resolution electron microscopy with the imaging plate

✍ D. Shindo; K. Hiraga; T. Oku; T. Oikawa 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 669 KB