𝔖 Bobbio Scriptorium
✦   LIBER   ✦

High resolution electron microscopy study of the ErSi2/Si(111) interface

✍ Scribed by C. D'Anterroches; P. Perret; F.Arnaud D'Avitaya; J.A. Chroboczek

Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
624 KB
Volume
184
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Microstructure of carbons: a high resolu
Microstructure of carbons: a high resolution electron microscopy study
✍ L.L. Ban; W.M. Hess πŸ“‚ Article πŸ“… 1972 πŸ› Elsevier Science 🌐 English βš– 113 KB

Luzzati's method for the evaluation of multiple X-ray small angle scattering has been revised and completed. Under the usual experimental conditions multiple scattering occurs practically in all cases in which the produce of the average pore size (in A) and the volume fraction of pores is larger tha

High resolution electron microscopy inve
High resolution electron microscopy investigations of interface and other structure defects in some ceramics
✍ Wen, Shulin; Liu, Qian πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 519 KB

Interface, grain boundary, and other structure defects are the most important structural factors to affect the properties of ceramics materials. The present paper shows the relationship between the properties and those structure features such as grain boundaries, phase boundaries, interfaces, twins,