High Resolution Electron Microscopy Study of Nanostructured Ni2Si Thin Films

✍ Scribed by da Rocha Bernardo, J. R. ;de Almeida, L. H. ;Losch, W.

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 287 KB
• Volume: 173
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/(sici)1521-396x(199905)173:1<247::aid-pssa247>3.0.co;2-k