High-Resolution Electron Microscopy for Materials Science

✍ Scribed by Daisuke Shindo, Kenji Hiraga (auth.)

Publisher: Springer Tokyo
Year: 1998
Tongue: English
Leaves: 195
Edition: 1
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

✦ Table of Contents

Front Matter....Pages II-IX
Basis of High-Resolution Electron Microscopy....Pages 1-15
Practice of High-Resolution Electron Microscopy....Pages 17-39
Application of High-Resolution Electron Microscopy....Pages 41-128
Peripheral Instruments and Techniques for High-Resolution Electron Microscopy....Pages 129-168
Back Matter....Pages 169-190

✦ Subjects

Characterization and Evaluation of Materials;Measurement Science and Instrumentation

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