Analytical Electron Microscopy for Materials Science

✍ Scribed by Daisuke Shindo, Tetsuo Oikawa (auth.)

• Publisher: Springer Tokyo
• Year: 2002
• Tongue: English
• Leaves: 161
• Edition: 1
• Category: Library

✦ Synopsis

Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

✦ Table of Contents

Front Matter....Pages N1-IX
Basic Principles of Analytical Electron Microscopy....Pages 1-11
Constitution and Basic Operation of Analytical Electron Microscopes....Pages 13-41
Electron Energy-Loss Spectroscopy....Pages 43-80
Energy Dispersive X-ray Spectroscopy....Pages 81-102
Peripheral Instruments and Techniques for Analytical Electron Microscopy....Pages 103-136
Back Matter....Pages 137-155

✦ Subjects

Condensed Matter Physics