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High resolution electron microscopy and x-ray singel crystal diffraction on Ba0.6Ti2.8Ga1.208, a hollandite

✍ Scribed by H.W. Zandbergen; F.C. Mijlhoff; D.J.W. Ijdo

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 125 KB
Volume: 15
Category: Article
ISSN: 0304-3991
DOI: 10.1016/0304-3991(84)90193-1

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