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A study of the domain structure of carbon black by both high-resolution dark-field electron microscopy and X-ray diffraction

✍ Scribed by M.L. Rudee

Publisher
Elsevier Science
Year
1967
Tongue
English
Weight
677 KB
Volume
5
Category
Article
ISSN
0008-6223

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✦ Synopsis

High-resolution dark-field electron microscopy was used to observe the domain structure in IRB-2 carbon black. The domains are equiaxed with a dia. of 16 f0.5 A. Most of them have their layerplanes tangent to the surface of the surface of the particle, but occasional domains are observed that are not oriented in this manner. The same carbon black has also been studied by X-ray diffraction techniques. The measured value of the domain size normal to the layer-planes is 16.5 11; this is in excellent agreement with the electron-microscopic observations. However, the measured values of the layer-plane size varies from 30 a to 43 ip, depending on the method used to analyze the data.

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Bent bonds in the strained fullerene system, restricted to the [5,6] bonds, were detected by high-resolution X-ray structure analysis of the 1,2-dihydro[60]fullerene derivative 1. In addition the maxima of electron densities are higher in the [6,6] bonds than in the [5,6] bonds-an important finding