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High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures

✍ Scribed by T. Osipowicz; H.L. Seng; L.S. Wielunski; E.S. Tok; G. Breton; J. Zhang

Book ID
114165613
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
317 KB
Volume
190
Category
Article
ISSN
0168-583X

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