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High Quality Strained Ge Epilayers on a Si[sub 0.2]Ge[sub 0.8]/Ge/Si(100) Global Strain-Tuning Platform

✍ Scribed by Myronov, Maksym; Dobbie, Andy; Shah, Vishal A.; Liu, Xue-Chao; Nguyen, Van H.; Leadley, David R.

Book ID: 127175245
Publisher: The Electrochemical Society
Year: 2010
Tongue: English
Weight: 338 KB
Volume: 13
Category: Article
ISSN: 1099-0062
DOI: 10.1149/1.3482159

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