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High Pinout IC Packaging and the Density Advantage of Surface Mounting

โœ Scribed by Knausenberger, W.; Teneketges, N.


Book ID
117911480
Publisher
IEEE
Year
1983
Tongue
English
Weight
739 KB
Volume
6
Category
Article
ISSN
0148-6411

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Wire sweep has been recognized as one of the major defects in the encapsulation of microelectronic chips by the transfer molding process. As thinner and denser IC packages emerge, wire-sweep analysis becomes more challenging and troublesome. This paper studies the reactive flow in IC encapsulation