High-Level Test Synthesis With Hierarchical Test Generation for Delay-Fault Testability

✍ Scribed by Sying-Jyan Wang; Tung-Hua Yeh

• Book ID: 117908298
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 907 KB
• Volume: 28
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2009.2026360