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๐Ÿ“

High-level estimation and exploration of reliability for multi-processor system-on-chip

โœ Scribed by Chattopadhyay, Anupam; Wang, Zheng


Publisher
Springer
Year
2018
Tongue
English
Leaves
210
Series
Computer architecture and design methodologies
Category
Library

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โœฆ Synopsis


This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of Read more...


Abstract: This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures

โœฆ Table of Contents


Front Matter....Pages i-xx
Introduction....Pages 1-4
Background....Pages 5-10
State-of-the-Art....Pages 11-28
High-Level Fault Injection and Simulation....Pages 29-80
Architectural Reliability Estimation....Pages 81-117
Architectural Reliability Exploration....Pages 119-153
System-Level Reliability Exploration....Pages 155-176
Conclusion and Outlook....Pages 177-179
Back Matter....Pages 181-197

โœฆ Subjects


Systems on a chip;Fault-tolerant computing;COMPUTERS / General


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