High-current failure model for VLSI interconnects under short-pulse stress conditions

✍ Scribed by K. Banerjee; A. Amerasekera; N. Cheung; Chenming Hu

• Book ID: 126659831
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 109 KB
• Volume: 18
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/55.622511