✦ LIBER ✦
Percolative approach for failure time prediction of thin film interconnects under high current stress
✍ Scribed by E. Misra; Md M. Islam; Mahbub Hasan; H.C. Kim; T.L. Alford
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 133 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.