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Hierarchical test generation and design for testability methods for ASPPs and ASIPs

✍ Scribed by Ghosh, I.; Raghunathan, A.; Jha, N.K.

Book ID: 119778436
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 361 KB
Volume: 18
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.748165

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