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Hardness Assurance Statistical Methodology for Semiconductor Devices

✍ Scribed by Arimura, I.; Namenson, A. I.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Hardness-assurance and testing issues fo

✍ Nowlin, R.N.; Fleetwood, D.M.; Schrimpf, R.D.; Pease, R.L.; Combs, W.E. 📂 Article 📅 1993 🏛 IEEE 🌐 English ⚖ 808 KB

Statistical Treatment of Damage Factors

✍ Namenson, A. I. 📂 Article 📅 1979 🏛 IEEE 🌐 English ⚖ 555 KB

Statistical Modeling of Semiconductor De

✍ Messenger, George C.; Steele, Earl L. 📂 Article 📅 1968 🏛 IEEE 🌐 English ⚖ 978 KB

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✍ B.N. Aditya; Navneet Gupta 📂 Article 📅 2012 🏛 Elsevier Science ⚖ 334 KB

An Integrated CAD Methodology for Yield

✍ Massimo Conti; Paolo Crippa; Simone Orcioni; Marcello Pesare; Claudio Turchetti; 📂 Article 📅 2003 🏛 Springer 🌐 English ⚖ 778 KB

Coaxial current transformer for test and

✍ Lyra, R.O.C.; Cardoso Filho, B.J.; John, V.; Lipo, T.A. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 297 KB