✦ LIBER ✦
An Integrated CAD Methodology for Yield Enhancement of VLSI CMOS Circuits Including Statistical Device Variations
✍ Scribed by Massimo Conti; Paolo Crippa; Simone Orcioni; Marcello Pesare; Claudio Turchetti; Loris Vendrame; Silvia Lucherini
- Book ID
- 111550874
- Publisher
- Springer
- Year
- 2003
- Tongue
- English
- Weight
- 778 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0925-1030
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