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Hardness-assurance and testing issues for bipolar/BiCMOS devices

✍ Scribed by Nowlin, R.N.; Fleetwood, D.M.; Schrimpf, R.D.; Pease, R.L.; Combs, W.E.

Book ID: 118234804
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 808 KB
Volume: 40
Category: Article
ISSN: 0018-9499
DOI: 10.1109/23.273492

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