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A study of ESD protection devices for input pins. Discharge characteristics of diode, lateral bipolar transistor, and thyristor under MM and HBM tests

✍ Scribed by Ishizuka, H.; Okuyama, K.; Kubota, K.; Komuro, M.; Hara, Yu.


Book ID
114560667
Publisher
IEEE
Year
1998
Weight
613 KB
Volume
21
Category
Article
ISSN
1083-4400

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