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Hard x-ray Zernike microscopy reaches 30 nm resolution

✍ Scribed by Chen, Yu-Tung; Chen, Tsung-Yu; Yi, Jaemock; Chu, Yong S.; Lee, Wah-Keat; Wang, Cheng-Liang; Kempson, Ivan M.; Hwu, Y.; Gajdosik, Vincent; Margaritondo, G.

Book ID
115434509
Publisher
Optical Society of America
Year
2011
Tongue
English
Weight
460 KB
Volume
36
Category
Article
ISSN
0146-9592

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