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Soft X-ray microscopy at a spatial resolution better than 15 nm

✍ Scribed by Chao, Weilun; Harteneck, Bruce D.; Liddle, J. Alexander; Anderson, Erik H.; Attwood, David T.

Book ID: 109894395
Publisher: Nature Publishing Group
Year: 2005
Tongue: English
Weight: 293 KB
Volume: 435
Category: Article
ISSN: 0028-0836
DOI: 10.1038/nature03719

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