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Hard x-ray nanobeam characterization by coherent diffraction microscopy

✍ Scribed by Schropp, A.; Boye, P.; Feldkamp, J. M.; Hoppe, R.; Patommel, J.; Samberg, D.; Stephan, S.; Giewekemeyer, K.; Wilke, R. N.; Salditt, T.

Book ID: 121475980
Publisher: American Institute of Physics
Year: 2010
Tongue: English
Weight: 440 KB
Volume: 96
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.3332591

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