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Two-dimensional measurement of focused hard X-ray beam profile using coherent X-ray diffraction of isolated nanoparticle

✍ Scribed by Yukio Takahashi; Hideto Kubo; Ryosuke Tsutsumi; Shigeyuki Sakaki; Nobuyuki Zettsu; Yoshinori Nishino; Tetsuya Ishikawa; Kazuto Yamauchi

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
671 KB
Volume
616
Category
Article
ISSN
0168-9002

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## Abstract A transmission method and experimental set‐up were developed for the nondestructive characterisation of the quality of bulk single crystals/ large coarsely crystalline polycrystals or components. The method works by combination of X‐ray projection microscopy (X‐ray shadow microscopy) wi