𝔖 Bobbio Scriptorium

✦ LIBER ✦

Guest Editorial Second Special Section of the IEEE Transactions on Instrumentation and Measurement in the Area of VLSI Testing—Future of Semiconductor Test

✍ Scribed by Das, S.R.; Rajsuman, R.

Book ID: 114630165
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 282 KB
Volume: 55
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2006.873383

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Guest Editorial First Special Section of

Guest Editorial First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing—Future of Semiconductor Test

✍ Das, S.R.; Rajsuman, R. 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 41 KB

[IEEE 2012 Second International Conferen

[IEEE 2012 Second International Conference on Instrumentation, Measurement, Computer, Communication and Control (IMCCC) - Harbin City, Heilongjiang, China (2012.12.8-2012.12.10)] 2012 Second International Conference on Instrumentation, Measurement, Computer, Communication and Control - The Research of Memory Fault Simulation and Fault Injection Method for BIT Software Test

✍ Xu, Jun; Xu, Ping 📂 Article 📅 2012 🏛 IEEE ⚖ 329 KB

[IEEE 2007 8th International Conference

[IEEE 2007 8th International Conference on Electronic Measurement and Instruments - Xian, China (2007.08.16-2007.07.18)] 2007 8th International Conference on Electronic Measurement and Instruments - A Design of the Test According to Amplitude-frequency Characteristic in the Radar Antenna Control System

✍ Junwei, Lv; Zhiyun, Wang; zhouchen, Xue 📂 Article 📅 2007 🏛 IEEE ⚖ 496 KB

[IEEE 2013 3rd International Conference

[IEEE 2013 3rd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications (ANIMMA) - Marseille, France (2013.06.23-2013.06.27)] 2013 3rd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications (ANIMMA) - Overview of requirements and design integration for the ITER EU Test Blanket Systems instrumentation

✍ Calderoni, Pattrick; Vallory, Joelle; Zmitko, Milan; Ricapito, Italo; Poitevin, 📂 Article 📅 2013 🏛 IEEE ⚖ 731 KB