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Guest Editorial First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing—Future of Semiconductor Test

✍ Scribed by Das, S.R.; Rajsuman, R.

Book ID: 114630010
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 41 KB
Volume: 54
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2005.857481

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