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[IEEE 2012 Second International Conference on Instrumentation, Measurement, Computer, Communication and Control (IMCCC) - Harbin City, Heilongjiang, China (2012.12.8-2012.12.10)] 2012 Second International Conference on Instrumentation, Measurement, Computer, Communication and Control - The Research of Memory Fault Simulation and Fault Injection Method for BIT Software Test

✍ Scribed by Xu, Jun; Xu, Ping

Book ID: 126757439
Publisher: IEEE
Year: 2012
Weight: 329 KB
Category: Article
ISBN: 0769549357
DOI: 10.1109/IMCCC.2012.174

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