Growth temperature effect on the heteroepitaxy of InSb on Si(111)
β Scribed by B.V Rao; T Okamoto; A Shinmura; D Gruznev; M Mori; T Tambo; C Tatsuyama
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 991 KB
- Volume
- 159-160
- Category
- Article
- ISSN
- 0169-4332
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β¦ Synopsis
Direct growth of InSb on Si 111 substrate is achieved by suitably adjusting the growth rate and substrate temperature. In this report, we detail the role of stoichiometry and growth temperature in the evolution of reflection high-energy electron Ε½ . Ε½ .Ε½ . diffraction RHEED patterns, surface morphology and the crystal quality. InSb is grown on Si 111 -7 = 7 surface by evaporating In and Sb simultaneously. Results indicate that smooth heteroepitaxial InSb films could be grown up to 3008C, and above this temperature, severe degradation in the epitaxial quality of the films is observed. Properties of the Sb-rich films are compared with those of In-rich films and the importance of stoichiometry in the crystal quality is discussed.
π SIMILAR VOLUMES
Germanium is a suitable material as the buffer layer for the heteroepitaxial growth of InSb films on a Si 001 substrate. It reduces the large lattice mismatch of about 19.3% between Si and InSb to about 14.5%. InSb films grown on the islanded Ε½ . Β² : Ge buffer layers on a Si 001 substrate at elevat