Growth of nonpolar m-plane GaN (1 0 −1 0) single crystal on (1 0 0) LiAlO2 substrate by a newly designed hydride vapor phase epitaxy
✍ Scribed by Mitch M.C. Chou; Chenlong Chen; Jin-Wei Lu; Chu-An Li; Chuck W.C. Hsu; Calvin Liu
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 607 KB
- Volume
- 316
- Category
- Article
- ISSN
- 0022-0248
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✦ Synopsis
A newly designed two-step reactor which places both chemical vapor deposition (CVD) and hydride vapor phase epitaxy (HVPE) in series is proposed to grow nonpolar m-plane GaN (1 0 À 1 0) material on a closely lattice-matched (1 0 0) LiAlO 2 single crystal substrate. The surface morphologies are characterized by scanning electron microscopy. Structural properties of the GaN epilayers are investigated by X-ray diffraction, and the FWHM of GaN (1 0 À 1 0) rocking curve is around 0.131. Optical and electrical properties are evaluated by photoluminescence spectroscopy, optical transmission spectra and Hall measurement. Photoluminescence spectroscopy exhibited a near band edge emission peak at 3.410 eV. The carrier concentration is (3.9 7 0.01) Â 10 18 cm À 3 .
📜 SIMILAR VOLUMES
a b s t r a c t (1 0 0)-oriented b-FeSi 2 films were epitaxially grown on 3C-SiC-buffered Si(1 0 0) substrates by co-sputtering iron and silicon. The full-width at half maximum of the rocking curve of the b-FeSi 2 800 diffraction peaks was 1.81. The epitaxial relationship between b-FeSi 2 and 3C-Si