Growth of Anodic films on valve metals
β Scribed by T. Hurlen; E. Gulbrandsen
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 392 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0013-4686
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β¦ Synopsis
Ahstraet
-By analysis of transport number and F-log j data for valve metals under galvanostatic anodization, obedience is found to the kink dependent Cabrera-Mott equation for irreversible transfer of metal ions from metal to oxide and to the defect dependent high-field ion migration equation for transport of both metal and oxygen ions in the growing anodic film. For Al, the kink and defect dependences are d log s/d log j = 0.5 and d log N/d log j approaching 0.67 at low current densities (oxygen ion transport) and 0.5 at high ones (metal ion transport), and the ion transfer valence is n = 3. The denser is the oxygen packing in the oxide, the higher is the electric field needed to drive a given ionic current through it.
π SIMILAR VOLUMES
## Abstract The kinetics of growth of the open circuit insulating oxide films on Hf, Ta, Nb, Zr and Al were studies in many salt solutions using potential and capacitance measurements. The effect of salt type and concentration, oxygen concentration, temperature and surface pretreatment on the growt
The title subject is studied by galvanostatic E-t curves on 20 h stabilized passive tin electrodes in weakly alkaline phosphate solution (pH9.5) at 25Β°C. These curves generally exhibit a small initial superpolarization ascribed to transient changes in the surface density of kinks (s) by the current