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Growth characteristics evaluations on the 3D nanostructure fabrication by the high accuracy control of focused-ion-beam

✍ Scribed by Reo Kometani; Takayuki Hoshino; Shin’ichi Warisawa; Sunao Ishihara


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
465 KB
Volume
86
Category
Article
ISSN
0167-9317

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The fabrication of high-aspect-ratio submicron-to-nanometer range microstructures in LiNbO using a state-of-the-art Schlum-3 ( ) berger AMS 3000 focused ion-beam FIB system is presented. The submicron structures with about 350 nm width and 1600 nm depth are fabricated by employing XeF gas-assisted g