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Growth and Structure of Water on SiO 2 Films on Si Investigated by Kelvin Probe Microscopy and in Situ X-ray Spectroscopies

✍ Scribed by Verdaguer, Albert; Weis, Christoph; Oncins, Gerard; Ketteler, Guido; Bluhm, Hendrik; Salmeron, Miquel

No coin nor oath required. For personal study only.

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