Transmission electron microscopy and X-ray diffraction investigation of phase formation and transition between Pd2Si and PdSi in Pd thin films on (111)Si

✍ Scribed by J.F. Chen; L.J. Chen

• Book ID: 113300322
• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 818 KB
• Volume: 39
• Category: Article
• ISSN: 0254-0584
• DOI: 10.1016/0254-0584(94)01437-l