X-ray diffraction, atomic force microscopy and raman spectroscopy studies of microstructure of BiFeO3thin films on Pt/Ti/SiO2/Si (111) substrates

X-ray diffraction and Raman study of nan

X-ray diffraction and Raman study of nanogranular BaTiO3-CoFe2O4thin films deposited by laser ablation on Si/Pt substrates

✍ Barbosa, J. ;Almeida, B. ;Mendes, J. A. ;Rolo, A. G. ;Araújo, J. P. 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 337 KB

## Abstract Nanocomposite thin films composed by (BaTiO~3~)~1–__x__~ –(CoFe~2~O~4~)__~x~__ with different cobalt ferrite concentrations (__x__) have been deposited by pulsed laser ablation on platinum covered Si(001) substrates. The films structure was studied by X‐ray diffraction and Raman spectro