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Growth and characterization of epitaxial Ti3GeC2 thin films on 4H-SiC(0001)

✍ Scribed by K. Buchholt; P. Eklund; J. Jensen; J. Lu; R. Ghandi; M. Domeij; C.M. Zetterling; G. Behan; H. Zhang; A. Lloyd Spetz; L. Hultman

Book ID: 116630209
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 571 KB
Volume: 343
Category: Article
ISSN: 0022-0248
DOI: 10.1016/j.jcrysgro.2012.01.020

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