๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Growth and characterization of Ba(Cd1/3Ta2/3)O3 thin films

โœ Scribed by L.T. Liu; C. Kopas; R.K. Singh; R.M. Hanley; N. Newman

Book ID
113937755
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
943 KB
Volume
520
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Growth and characterization of epitaxial
Growth and characterization of epitaxial Ba(Zn1/3Ta2/3)O3 (1 0 0) thin films
โœ Z.Z. Tang; S.J. Liu; R.K. Singh; S. Bandyopadhyay; I. Sus; T. Kotani; M van Schi ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 988 KB

We have synthesized and characterized epitaxial and stoichiometric Ba(Zn 1/3 Ta 2/3 )O 3 (1 0 0) dielectric thin films grown on MgO (1 0 0) substrates by pulsed laser deposition. Advanced electronic structure calculations were used to guide the interpretation of the experimental data. Zn-enriched ta

Growth and characterization of Y2O3 thin
Growth and characterization of Y2O3 thin films
โœ Xuerui Cheng; Zeming Qi; Guobin Zhang; Hongjun Zhou; Weiping Zhang; Min Yin ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 266 KB

Y 2 O 3 thin films were grown on silicon (1 0 0) substrates by pulsed-laser deposition at different substrate temperatures and O 2 pressures. The structure and composition of films are studied by using X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). The Y 2 O 3 thin films deposit