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Grazing Incidence X-ray Diffraction Measurements of Columnar InAs/GaAs Quantum Dot Structures

โœ Scribed by Mukai, Kohki; Watanabe, Keita; Kimura, Yuuta

Book ID
120364574
Publisher
Institute of Pure and Applied Physics
Year
2010
Tongue
English
Weight
307 KB
Volume
49
Category
Article
ISSN
0021-4922

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๐Ÿ“œ SIMILAR VOLUMES

Grazing incidence X-ray diffraction stud
Grazing incidence X-ray diffraction study of the InAs/GaAs interface
โœ H. Rhan ๐Ÿ“‚ Article ๐Ÿ“… 1996 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 275 KB

Due to the strongly restricted penetration depth, X-ray diffraction under grazing incidence and exit allows observation and characterisation of ultra-thin interface layers down to thicknesses of one monolayer, even though it may be covered by a much larger one. Because of the special geometry, this